Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium proceedings 2005 : San Jose, CA, USA, March 15-17, 2005 by IEEE Semiconductor Thermal Measurement and Management Symposium (21st 2005 San Jose, Calif.)

Cover of: Twenty First Annual IEEE Semiconductor Thermal Measurement and Management Symposium | IEEE Semiconductor Thermal Measurement and Management Symposium (21st 2005 San Jose, Calif.)

Published by IEEE in Piscataway, N.J .

Written in English

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Subjects:

  • Semiconductors -- Thermal properties -- Congresses,
  • Semiconductors -- Cooling -- Congresses

Edition Notes

Book details

Other titlesSemiconductor Thermal Measurement and Management Symposium., SEMI-THERM 21., Semiconductor Thermal Measurement and Management Symposium, 2005 IEEE Twenty First Annual IEEE.
StatementIEEE Components, Packaging, and Manufacturing Technology Society, National Institute of Standards and Technology.
GenreCongresses.
ContributionsComponents, Packaging & Manufacturing Technology Society., National Institute of Standards and Technology (U.S.), IEEE Xplore (Online service)
Classifications
LC ClassificationsTK7871.75 .I27 2005eb
The Physical Object
FormatElectronic resource
Pagination[xviii], 360, [2] p.
Number of Pages360
ID Numbers
Open LibraryOL17628487M
ISBN 100780389859, 0780389867
OCLC/WorldCa60338721

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